Vol. 47, Issue 3, pp. 363-372
Keywords
optical characterization, two-dimensional materials, graphene, Brewster angle, differential reflectance
Abstract
Visibility and simple optical diagnostics possibilities of graphene layers on dielectric and semiconductor substrates at the Brewster angle are analyzed. The analysis is based on a numerical simulation. Several oxide semiconductors (ITO, ZnO, TiO2), weakly absorbing Si, and strongly absorbing GaAs are considered. It is shown that at the Brewster angle the optical contrast of graphene flakes on a bare semiconductor substrate is actually strong enough to see them under an optical microscope and there is really no need to create an additional interference film on the substrate.