Vol. 50, Issue 3, pp. 447-461

Vol. 50 Issue 3 pp. 447-461

Optical trapping of the low index of refraction particles by focused vortex beams and two face-to-face focused beams

Meiling Duan, Hanghang Zhang, Jinhong Li

Keywords

optical trapping, GSM vortex beams, two face-to-face focused beams, radiation forces

Abstract

Using the extended Huygens–Fresnel principle and Rayleigh scattering theory, optical trapping of the low index of refraction particles using a focused Gaussian Schell-model (GSM) non-vortex beam, a focused GSM vortex beam, and two face-to-face focused GSM vortex beams have been studied. The results demonstrate that the focused GSM non-vortex beam cannot capture the low index of refraction particles, however, the focused GSM vortex beam can be a two-dimensional trap of particles in the z-axis, and the transverse gradient force Fgrad, x and the trapping equilibrium region increase as the topological charge m increases. As the focal length f or the refractive index of particles np decreases, the radiation forces increase and the trapping ability also enhances. To trap the low index particles in three-dimensional space, we adopt that the two face-to-face focused GSM vortex beams can be used to construct an optical potential well. The transverse gradient force of two face-to-face focused GSM vortex beams is twice that of a single GSM vortex beam. The limit of the radius for the low index of refraction particles that were stably captured has also been determined. The obtained results provide valuable information for trapping and manipulating the low index of refraction particles using GSM vortex beams, which may be applied in micromanipulation, biotechnology, nanotechnology and so on.

Vol. 50
Issue 3
Article No: 10
pp. 447-461

0.53 MB
OPTICA APPLICATA - a quarterly of the Wrocław University of Science and Technology, Faculty of Fundamental Problems of Technology