Vol. 28, Issue 3, pp. 213-226

  1. Archive
  2. Optica Applicata Vol. 28, Issue 3, pp. 213-226 (1998)
Vol. 28 Issue 3 pp. 213-226

Tunable axial resolution in confocal scanning microscopy by controlled symmetrical defocusing

Manuel Martinez-Corral, Marek Kowalczyk, Carlos Zapata-Rodríguez, Pedro Andrés

Abstract

There is presented a quite simple technique for improving the axial resolution capacity of confocal scanning microscopes without detriment to their transverse resolution. The technique, that is based on the equal contribution to the image of the illuminating and collecting lenses, consists in symmetrical defocusing of both parts of the imaging system.

Vol. 28
Issue 3
pp. 213-226

4.06 MB
OPTICA APPLICATA - a quarterly of the Wrocław University of Science and Technology, Faculty of Fundamental Problems of Technology