Vol. 35, Issue 2, pp. 191-199

Abstract

Transparent iron-doped titanium oxide thin films were prepared on soda-lime-silica glass substrate from a titanium naphthenate precursor. Films prefired at 500°C for 10 min were finally annealed at 500°C for 30 min in air. Field emission–scanning electron microscope and scanning probe microscope were used for characterizing the surface structure of the film. A sharp absorption edge of the film was observed. The film containing iron showed a shift towards the visible in the absorption threshold.