Vol. 35, Issue 3, pp. 479-484

  1. Archive
  2. Optica Applicata Vol. 35, Issue 3, pp. 479-484 (2005)
Vol. 35 Issue 3 pp. 479-484

Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes

Tomasz J. OCHALSKI, Tomasz PIWONSKI, Dorota WAWER, Kamil PIERSCINSKI, Maciej BUGAJSKI, Anna KOZLOWASKA, Andrzej MALAG, Jens W. TOMM

Keywords

thermoreflectance, Raman spectroscopy, semiconductor laser

Abstract

In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.

Vol. 35
Issue 3
pp. 479-484

0.79 MB
OPTICA APPLICATA - a quarterly of the Wrocław University of Science and Technology, Faculty of Fundamental Problems of Technology