Vol. 35, Issue 3, pp. 555-560
Keywords
Raman spectroscopy, catastrophic optical mirror damage (COMD), high-power laser, thermoreflectance
Abstract
Spatially resolved micro-Raman measurements have been performed to determine temperature distribution over the facet of high power semiconductor diode lasers. This technique is non-invasive and allows one to study the local temperature on the surface of the mirror of semiconductor diode lasers under normal operating conditions. The micro-Raman measurements can also serve as a calibration of absolute temperature for the other contact-less thermometric methods, e.g., thermoreflectance.