Vol. 42, Issue 3, pp. 667-675
Keywords
cadmium telluride thin films, film thickness, optical parameters
Abstract
Ellipsometric parameters of CdTe films prepared by “hot-wall” vacuum-epitaxy method on single crystal Si substrates were measured at the wavelength of 632.8 nm. Refractive index, extinction coefficient and thickness of the films were determined. Based on the Maxwell–Garnett approximation of inhomogeneous material containing inclusions of different components (cavities, oxides) the refractive indices and extinction coefficients of effective media were calculated. Optical parameters of the film were found to depend on its thickness, which could be explained by different volume concentration of the substance in the film depth.