Vol. 30, Issue 4, pp. 543-551

Abstract

Presents results obtained by the application of the method of thermally stimulated depolarization (TSD) to investigate dipole relaxation in SiO₂ xerogels. The presence of a strong temperature gradient in the sample has been revealed during measurements of the TSD current. The paper describes the method of determination of activation energy W, initial polarization P₀ and factor τ₀, for the dipole relaxation processes under investigation. It has been shown that the modified TSD method is a sensitive tool for the investigation of changes taking place in the peripheral molecular layer on the surface of pores in SiO₂ xerogels.