Vol. 10, Issue 4, pp. 445-450

Abstract

The index of refraction of thin films of zirconium dioxide was determined in wavelength range of 250-1200nm. Multilayer dielectric mirrors were prepared using zirconium dioxide and silicon dioxide. The radiant reflectance exceeded 97.9% at a wavelength of 337nm and 98.7% at a wavelength of 600nm on fused silica-Tetrasil A substrate.