Vol. 28, Issue 3, pp. 173-182 (1998)

Vol. 28 Issue 3 pp. 173-182

Optimization of the optical granularity measurement conditions of model photographic layers

Piotr Skipirzepski, Piotr Nowak

Abstract

Computer results of the model dependence of the measured optical granularity on the area of the measuring aperture are presented. The optical granularity is expressed as a standard deviation of the optical density fluctuations. A spherical shape of the silver grains was assumed in the theoretical model of the developed photographic layer. The microdensitometric measurements were simulated assuming various conditions. This model and the results obtained are intended to help to further develop an integrated simulation system for research on the structurometric properties of silver-halide photographic layers.

Vol. 28
Issue 3
pp. 173-182

3.2 MB

Corresponding address

Optica Applicata
Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Publisher

Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

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