Vol. 30, Issue 1, pp. 183-188 (2000)

Vol. 30 Issue 1 pp. 183-188

Optical characterisation of strained-layer InxGa1-xAs/GaAs MQW LED grown by MOVPE

Sek Grzegorz, Ciorga Mariusz, Bryja Leszek, Misiewicz Jan, Radziewicz Damian, Sciana Beata, Tlaczala Marek

Abstract

We present the use of photoreflectance (PR) spectroscopy combined with the standard photoluminescence (PL) and electroluminescence (EL) for the room temperature optical investigation of strained-layer multiple quantum well (MQW) IInxGa1-xAs/GaAs light emitting diode (LED) for 1040 nm. In the PR spectra, except the fundamental transition observed also in the emission spectra, two extra features related to the active region of the device have been seen. The presence of these two excited state transitions allowed the band structure to be analysed and the correctness of the device performance to be checked. We repeated the measurements after the top p-doped GaAs cladding layer had been etched off and discussed the changes of the built-in electric field. (16 References).

Vol. 30
Issue 1
pp. 183-188

0.27 MB

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Optica Applicata
Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
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Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

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