Vol. 30, Issue 4, pp. 641-646 (2000)
Abstract
Spectroscopic properties of encapsulated porous silicon (PS) have been studied in detail. In order to investigate different heterostructures of porous silicon a complex of analysis methods such as photoluminescence (PL) electroluminescence (EL), cathodoluminescence (CL) and thermostimulated depolarisation (TSD) were applied. The process of light emission shows a tendency to decrease. This decrease varies for different kinds of luminescence. The EL intensity dynamics depends on polarization effects in porous silicon.