Vol. 40, Issue 1, pp. 197-208 (2010)

Vol. 40 Issue 1 pp. 197-208

Measurement and statistical modeling of BRDF of various samples

Hanlu Zhang, Zhensen Wu, Yunhua Cao, Geng Zhang

Keywords

bidirectional reflectance distribution function (BRDF), modeling, measurement, light scattering

Abstract

Based on the Torrance–Sparrow model, a modified and simplified five-parameter model is obtained. Multi-angle bistatic reflectance data of surfaces of various materials are fitted using this model. Genetic algorithm is used to optimize the parameters for the model. The results of the five-parameter model are in good agreement with experimental data which do not take part in fitting, and are close to the results of two-dimensional bidirectional reflectance distribution function (BRDF) models. The five-parameter model shows a good applicability to various rough surfaces with different surface optical properties. The five-parameter model can be used to construct a three-dimensional BRDF distribution based on the spatial experimental data, which may provide more information on light scattering from rough surfaces.

Vol. 40
Issue 1
pp. 197-208

1.65 MB

Corresponding address

Optica Applicata
Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Publisher

Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Contact us

  • optica.applicata@pwr.edu.pl
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