Vol. 40, Issue 3, pp. 609-614

Abstract

Microscope thermography with the use of thermovision camera with spatial resolution 8 μm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices.