Vol. 42, Issue 2, pp. 315-322 (2012)
Keywords
antifungal thin layer, sol–gel method, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS)
Abstract
Sol–gel method was used to prepare SiO2–TiO2 thin layers on the microscope slide glasses with additions of Cu, Ag, Au compounds. The films were calcimined at 150 °C for 1 hour. We studied the morphology of the following samples by scanning electron microscopy (SEM with EDS analysis), and the X-ray photoelectron spectroscopy (XPS). Antifungal properties of the layers were tested with the use of fungi Penicyllium. The results have shown that the best antifungal effect among the examined layers has got the sample with Au ions addition.