Vol. 43, Issue 4, pp. 731-737 (2013)
Keywords
Fourier transform profilometry, refractive index change, photorefractive effect
Abstract
A method for probing refractive index changes in photorefractive crystals using an interferometric technique and digital image processing was proposed. Based on equal thickness interference in LiNbO3 crystal and Fourier transform profilometry, we obtained phase value changes in interferograms induced by a photorefractive effect, and further calculated refractive index changes. The maximal values for extraordinary light (e-light) and ordinary light (o-light) are 6.6×10–4 and 1.2×10–4, respectively.