Vol. 43, Issue 4, pp. 731-737

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  2. Optica Applicata Vol. 43, Issue 4, pp. 731-737 (2013)
Vol. 43 Issue 4 pp. 731-737

A method for probing the refractive index change in photorefractive crystals

Min Fu, Chengyong Gao, Xu’an Wang, Yuankai Cui, Shuwei Dai

Keywords

Fourier transform profilometry, refractive index change, photorefractive effect

Abstract

A method for probing refractive index changes in photorefractive crystals using an interferometric technique and digital image processing was proposed. Based on equal thickness interference in LiNbO3 crystal and Fourier transform profilometry, we obtained phase value changes in interferograms induced by a photorefractive effect, and further calculated refractive index changes. The maximal values for extraordinary light (e-light) and ordinary light (o-light) are 6.6×10–4 and 1.2×10–4, respectively.

Vol. 43
Issue 4
pp. 731-737

0.42 MB
OPTICA APPLICATA - a quarterly of the Wrocław University of Science and Technology, Faculty of Fundamental Problems of Technology