Archive

Optimization of the optical granularity measurement conditions of model photographic layers
Piotr Skipirzepski, Piotr Nowak
173-182 (1998)

3.2 MB
Modelling of the exposure distribution inside heterogeneous radiosensitive layers
Leszek Latacz, Piotr Nowak
183-190 (1998)

2.83 MB
Investigations of cavity losses in diode pumped lasers
Jan K. Jabczyński, Krzysztof Kopczyński, Piotr Marciniak
191-200 (1998)

2.91 MB
Optical calibration of the picosecond time scale and correlated background elimination in fluorescence dynamics measurements by time-correlated photon counting
K. Dobek, J. Karolczak, D. Komar, J. Kubicki, M. Szymański, T. Wróżowa, M. Ziółek, A. Maciejewski
201-208 (1998)

2.78 MB
Surface state density on the ZnTe and Cd0.98Fe0.02Te free surfaces
Kazimierz Pater, Stanisław Kuźmiński
209-212 (1998)

1.32 MB
Tunable axial resolution in confocal scanning microscopy by controlled symmetrical defocusing
Manuel Martinez-Corral, Marek Kowalczyk, Carlos Zapata-Rodríguez, Pedro Andrés
213-226 (1998)

4.06 MB
Fractional Fourier transform in optical setups
Eugeniusz Jagoszewski
227-238 (1998)

3.65 MB
Magneto-optical trap for rubidium atoms
Jerzy Zachorowski, Tadeusz Pałasz, Wojciech Gawlik
239-248 (1998)

3.8 MB
Letters to the Editor: Imaging of the clear slit in a two-photon coherent fluorescent microscope equipped with a pupil filter of 1-x2,x2, and Lanczos types
Anna Magiera
249-256 (1998)

1.4 MB
Conventional and fractional optical Fourier transform
Eugeniusz Jagoszewski
257-259 (1998)

0.92 MB

Corresponding address

Optica Applicata
Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Publisher

Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Contact us

  • optica.applicata@pwr.edu.pl
  • +48 71 320 23 93
  • +48 71 328 36 96