Vol. 43, Issue 2, pp. 359-371 (2013)
Keywords
THz imaging, metrology
Abstract
During the last decade there has been a significant interest in THz imaging technology and a series of both passive and active THz imagers have been developed. However, so far the methodology and test apparatus for testing passive THz imagers have been developed. In this paper, it has been proposed to test passive surveillance THz imagers using the test methodology prepared for testing surveillance thermal imagers. A test system developed for testing passive surveillance imagers is presented, too.