Vol. 46, Issue 2, pp. 291-303 (2016)

Vol. 46 Issue 2 pp. 291-303

Method for improving sinusoidal quality of error diffusion binary encoded fringe used in phase measurement profilometry

Zixia Tian, Wenjing Chen, Xianyu Su

Keywords

phase measurement profilometry, digital-light-processing (DLP) projector, error diffusion algorithm, binary encoded grating

Abstract

Insufficient resolution of digital-light-processing projector will degrade the sinusoidal quality of the binary encoded fringe pattern because of less sampling points in a fringe period, which will degrade the measurement accuracy if it is used in phase measurement profilometry. Two resolutions are proposed in the paper. One is that a cylindrical lens is introduced in the projecting light path of the measurement system to improve sinusoidal quality of the binary encoded fringe by elliptical low-pass filtering of the system. The other one is that superposition of multi-frame binary encoded gratings with different microstructure is to reduce the binary image noise for improving the measurement accuracy. Simulations and experiments verify the validity of the above two methods.

Vol. 46
Issue 2
pp. 291-303

0.63 MB

Corresponding address

Optica Applicata
Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

Publisher

Wrocław University of Science and Technology
Faculty of Fundamental Problems of Technology
Wybrzeże Wyspiańskiego 27
50-370 Wrocław, Poland

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