Vol. 46, Issue 4, pp. 597-605

Abstract

We present a new dual-wavelength quantitative measurement approach that can be employed for simultaneously measuring both the refractive index and the thickness of the homogenous specimen. This method is realized by dual-wavelength in-line phase-shifting digital holography, and then the phase images are obtained by using four-phase step algorithm for each wavelength separately. Based on computer simulation technology, the feasibility and the effectiveness of our proposed method are demonstrated by comparing our simulation results with the experimental results of the spherical silica bead and the red blood cell, respectively. Our work will provide some guidance in the experimental research for transparent phase objects.