Vol. 46, Issue 4, pp. 665-672 (2016)

Abstract

In this study, a polarization selective beam splitter constructed by only a single layer subwavelength multisubpart profile grating is presented. Rigorous coupled-wave analysis is adopted to investigate the properties of the structure. It is shown that for a transverse electric polarized wave, the device demonstrates very high reflectivity (>97%) from 1.46 to 1.58 μm; and for a transverse magnetic polarized wave, at the wavelength of 1.55 μm, it exhibits about 50/50 beam ratio under normal incidence. To evaluate the response of the polarizing beam splitters under variation in structure parameters, we also investigated the fabrication tolerances of the device.